A brief review has been presented on the Rietveld method and its recent development. It consists of (1) Introduction, (2) Recent development of the method, (3) Intensity measurements including pulsed neutron and synchroton radiation sources, (4) General principles and formula such as those for profile and preferred-orientation correction functions, (5) Computer programs, (6) Examples of the refinement, (7) Discussion, and (8) Concluding remarks.
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