2011 Volume 46 Issue 1 Pages 24-29
Recent trends have pushed the scientific instruments associated with electron microscopy toward computer-controlled and automatic operation. It could be very effective under such circumstances to apply mathematical treatments suitable for the microscopic and spectroscopic data characteristics and extract information embedded thereby as much as possible, particularly for noise reduction, resolution improvement and statistical information extraction. In the present article several signal and image processing techniques, their features and application examples, which have been done by the present author are introduced.
