TXRF Analysis of Solution Samples Using Polyester Film as a Disposable Sample-Carrier Cover

Abstract

The performance of polyester film was examined as a disposable cover of the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis of solution samples. Moreover, the measurement of Al K_α (1.487 keV) and P K_α (2.013 keV) peaks is possible because of the reduction of Si K_α X-rays (1.740 keV) from the sample-carrier. Not only the trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were successfully analyzed.