JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 77th JSAP Autumn Meeting 2016
Session ID : 16a-P4-5
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The strain dependence of thermal oxidation and hydrogen annealing effect at Si/SiO2 (001) interface in V-MOSFET
*Shingo KawachiShirakawa HirokiAraidai MasaakiKageshima HiroyukiEndoh TetsuoShiraishi Kenji
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© 2016 The Japan Society of Applied Physics
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