KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Approaches by an integrated software environment, Eos, in analyzing electron micrographs
Takuo Yasunaga
Author information
JOURNAL FREE ACCESS

2007 Volume 42 Issue 3 Pages 214-216

Details
Download PDF (2552K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© The Japanese Society of Microscopy
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Denshi kenbikyo

Share this page
feedback
 Top