Analysis of Hamaker Constant between Micro Tip and Inorganic Solid Surface using Atomic Force Microscope

Abstract

Hamaker constant between two solid surfaces is one important physical factor due to van der Waal's interaction. By measuring the adsorption force F[N] to the solid surface with a mico tip (curvature radius of tip apex R[m]). Hamaker constant A[J] can be obtained experimentally. Mean while, based on Lifshitz theory, Hamaker constant A between solid surfaces can be calculated with refractive index n and relative dielectric constant ε of the tip-sample materials. In this study, the positive correlation between two Hamaker constants obtained by these different methods is clearly confirmed. The validity and effectiveness of Hamaker constant analysis by the probe method can be confirmed. The possibility of identification of sample materials by this method is also discussed.