Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2003 Fall Meeting
Session ID : D12
Conference information
Development of ECT Inspection System using Inverse Analysis
Part I : Identification of Multiple Cracks using ECT Data
*Fumio Kojima, Futoshi Kobayashi, Daisuke Yorifuji, Shinya Oki, Akira Nishimizu, Masahiro Koike, Tetsuya Matsui
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Keywords: System Identification, Nondestructive Testing, Signal Processing, Network Communication
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[in Japanese]
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© 2003 Atomic Energy Society of Japan
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