Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2004 Fall Meeting
Session ID : E50
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Study on the Development of Low Exposure CT with Frisch Grid Avalanche Diode Detector
*Hideaki Onabe, Ikuo Kanno, Nobutsugu Imanishi, Akio Itoh, Koji Yoshida
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Keywords: Radiation Detector, Si Detector, Frisch Grid, Surface Activation Method, Direct Bonding, Current-Voltage Curve
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[in Japanese]
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© 2004 Atomic Energy Society of Japan
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