Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2008 Fall Meeting
Session ID : D35
Conference information
Transient void behavior in simulation tests for cold shutdown reactivity initiated accidents (II)
Effects of thermal equivalent diameter
*Akira SatouYu MaruyamaHideaki AsakaHideo Nakamura
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CONFERENCE PROCEEDINGS FREE ACCESS

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[in Japanese]
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© 2008 Atomic Energy Society of Japan
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