Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2008 Fall Meeting
Session ID : D35
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Transient void behavior in simulation tests for cold shutdown reactivity initiated accidents (II)
Effects of thermal equivalent diameter
*Akira Satou, Yu Maruyama, Hideaki Asaka, Hideo Nakamura
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Keywords: Reactivity initiated accident, Cold shutdown condition, Transient void behavior, Thermal equivalent diameter, Void fraction measurement using impedance technique
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Abstract
[in Japanese]
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© 2008 Atomic Energy Society of Japan
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