2010 Fall Meeting
Session ID : H04
Conference information
Evaluation of charge carrier trapping levels in CVD diamonds by use of an active carrier trapping and photo I-V mesurement
*Takuto Goto, Fumiyuki FUJITA, KANEKO H. Junichi, Kei SATO, Akinori KAKIMOTO, Yuta KONNO, Nobuteru TUBOUCHI, Yoshiaki MOKUNO, Akiyoshi CHAYAHARA, Akira HONMA, Shinichi SIKATA, Michihiro HURUSAKA
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