Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2011 Annual Meeting
Session ID : M19
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The calibration of charged particle emission rates for surface sources at AIST
*Yasushi Sato, Takahiro Yamada, Mikio Matsumoto, Shinichi Yamamoto, Yasuhiro Unno, Akira Yunoki
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Keywords: charged particle emission rate, surface source, multi ware proportional counter, Am-241, Cl-36
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[in Japanese]
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© 2011 Atomic Energy Society of Japan
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