Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2012 Annual Meeting
Session ID : E04
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Upgrade of fast reactor FFDL by means of Laser Resonance Ionization Mass Spectrometry (4)
Evaluation of the reliability of the gas tagging method for application to the FFDL system of the fast reactor
*Yoshihiro IwataChikara ItoHideki HaranoTakafumi Aoyama
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[in Japanese]
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© 2012 Atomic Energy Society of Japan
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