2012 Annual Meeting
Session ID : H43
Conference information
Properties and behavior of insoluble residue in the cold cap
(3)Imaging and XAFS analysis of simulated high-level waste glass
*YOSHIHIRO OKAMOTO, HIDEAKI SHIWAKU, MASAMI NAKADA, MASAHIDE TAKANO, MITSUO AKABORI, SATOSHI KOMAMINE, TOSHIKI FUKUI, EIJI OCHI
Author information
Keywords:
Synchrotron radiation,
Imaging,
XAFS,
Simulated high-level waste glass,
High-temperature melt
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