Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2013 Annual Meeting
Session ID : I56
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Host: Atomic Energy Society of Japan

Gamma-ray Induced Noise and Radiation Damage of Cooled CCD
*Ryoichi Taniguchi, Shuichi Okuda, Ken-ichi Okamoto, Tadashi Tsujimoto, Yoshihiro Ogawa
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Keywords: Radiation Imaging, Radiation Damage, CCD noise, Noise Analysis
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[in Japanese]
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© 2013 Atomic Energy Society of Japan
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