Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2013 Annual Meeting
Session ID : C30
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Host: Atomic Energy Society of Japan

Development of the residual stress measuring technique for irradiated materials by X-ray diffraction
*Hitoshi Seto, Fumihisa Kano, Yoshihide Ishiyama, Katsuhiko Ogiso, Shigeaki Tanaka, Hajime Miyata
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Keywords: residual stress, X-ray diffraction, irradiation, stainless steel
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[in Japanese]
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© 2013 Atomic Energy Society of Japan
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