Proceedings of Annual / Fall Meetings of Atomic Energy Society of Japan
2013 Annual Meeting
Session ID : I25
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Host: Atomic Energy Society of Japan

Applicability of the PHITS code to Tokamak Fusion Devices (2)
Application to a Break-even Plasma Test Facilities (JT-60)
*Atsuhiko Sukegawa, Koichi Okuno
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Keywords: Tokamak, Break-even Plasma Test Facilities, JT-60, PHITS, Activation, ACT-4, D-CHAIN
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[in Japanese]
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© 2013 Atomic Energy Society of Japan
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