Proceedings of the 40th annual Conference of the Institute of Image Electronics Engineers of Japan 2012
Session ID : R7-2
Conference information
Host: The Institute of Image Electronics Engineers of Japan
Name : Proceedings of the 40th Annual Conference of the Institute of Image Electronics Engineers of Japan 2012
Number : 40
Location : [in Japanese]
Date : June 23, 2012 - June 24, 2012
Bayesian estimation of imaging device's spectral sensitivities using ABIC
Details
Article 1st page
