Proceedings of the 43rd Annual Conference of the Institute of Image Electronics Engineers of Japan 2015
Session ID : S1-2
Conference information
Host: The Institute of Image Electronics Engineers of Japan
Name : Proceedings of the 43rd Annual Conference of the Institute of Image Electronics Engineers of Japan 2015
Number : 43
Location : [in Japanese]
Date : June 28, 2015 - June 29, 2015
Fundamental Examination and Analysis of “Beauty” of Paintings
－Result Analysis of Applying Basic Figures into Katsushika Hokusai’s “Thirty-six Views of Mount Fuji”－
Details
Article 1st page
