Proceedings of the Annual Conference of the Institute of Image Electronics Engineers of Japan
Online ISSN : 2436-4398
Print ISSN : 2436-4371
Proceedings of the 44th Annual Conference of the Institute of Image Electronics Engineers of Japan 2016
Session ID : S3-1
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Depth from Focus with Adaptive Focus Measure Size
*Yoichi MATSUBARAKeiichiro SHIRAIKiyoshi TANAKA
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Abstract
As a method for measuring the depth of micro-size objects, “Depth from Focus” (DFF) is known as an effective method. DFF methods evaluate focus from the texture sharpness of object surfaces. However, the sizes of texture pattern change the considering various sizes of texture patterns, filter window sizes have to be appropriately selected. Additionally, reducing bad effects caused by large edges is needed. In this paper , we propose a DFF method that adaptively selects window sizes depending on texture patterns.
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© 2016 The Institute of Image Electronics Engineers of Japan
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