Proceedings of the Annual Conference of the Institute of Image Electronics Engineers of Japan
Online ISSN : 2436-4398
Print ISSN : 2436-4371
Proceedings of the 48th Annual Conference of the Institute of Image Electronics Engineers of Japan 2020
Session ID : P-4
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An Adaptation Method of Keypoint Patch Location for 3D Point Cloud Registration
*Yohei SaitoKazuma UenishiMunetoshi IwakiriAguirre HernanKiyoshi Tanaka
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Abstract

3D point cloud registration is the process of integrating clouds obtained from multiple viewpoints into one coordinate system. In this process, the part that doesn’t overlap among clouds adversely affects the result. To avoid adversely effects, we propose a method to adaptively change the position of the keypoint-patches during registration process. The ICP that incorporation the proposed method is faster than the conventional evolutionary computation registration using the keypoint-patches and less dependence on the initial position than conventional ICP.

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© 2020 The Institute of Image Electronics Engineers of Japan
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