Host: The Institute of Image Electronics Engineers of Japan
Name : Proceedings of the 48th Annual Conference of the Institute of Image Electronics Engineers of Japan 2020
Number : 48
Location : [in Japanese]
Date : December 02, 2020 - December 04, 2020
Spectral measurements are used in a material analysis and scene recognition . The conventional spectrometer has a trade off between the resolution and the measurement range. In this study, we propose a super resolution method with sensor tilting and spectrally varying blur kernel estimation from sparse atomic emission lines. We experimentally validated that a spectrometer with the tilted sensor could achieve about 20 times better resolution than the raw measurement