Proceedings of the Annual Conference of the Institute of Image Electronics Engineers of Japan
Online ISSN : 2436-4398
Print ISSN : 2436-4371
Proceedings of the 48th Annual Conference of the Institute of Image Electronics Engineers of Japan 2020
Session ID : OS2-2
Conference information

Spectral Super-resolution Using Tilted Area Sensor and Spectrally-varying Blur Kernel Estimation
*Kazuya KitanoTakuya FunatomiRyohei YasukuniKenichiro TanakaHiroyuki KuboYoichiroh HosokawaYasuhiro Mukaigawa
Author information
CONFERENCE PROCEEDINGS RESTRICTED ACCESS

Details
Abstract

Spectral measurements are used in a material analysis and scene recognition . The conventional spectrometer has a trade off between the resolution and the measurement range. In this study, we propose a super resolution method with sensor tilting and spectrally varying blur kernel estimation from sparse atomic emission lines. We experimentally validated that a spectrometer with the tilted sensor could achieve about 20 times better resolution than the raw measurement

Content from these authors
© 2020 The Institute of Image Electronics Engineers of Japan
Previous article Next article
feedback
Top