Host: The Institute of Image Electronics Engineers of Japan
Name : Proceedings of the 48th Annual Conference of the Institute of Image Electronics Engineers of Japan 2020
Number : 48
Location : [in Japanese]
Date : December 02, 2020 - December 04, 2020
In this study, we propose a method to measure the spectral reflectance of silk fabric from an image and reproduce the color of silk fabric its using a reflection model. The spectral reflectance is only the diffuse reflection component must be measured, however in the case of silk fabric, the specular reflection due to the three-dimensional woven structure is incident, and the measurement accuracy of the spectral reflectance is reduced. In order to improve estimation accuracy, we propose a method to estimate the spectral reflectance of silk fabrics based on image measurement. Here, the image is measured with a camera equipped with a macro lens on the surface. Then, we propose a method of estimating the spectral reflectance from the diffuse reflection component by removing the specular reflection component from the histogram analysis of the measured image. The result shows that the accuracy of the estimation of the spectral reflectance of silk fabrics was improved.