Abstract
The spectra of highly scattering samples by FT-IR have large backgrounds and the back grounds influence the accuracy of analysis. Although a diffuse reflection method has been widely used for analyzing highly scattering samples, some problems have been pointed out for example, this method does not enable us to obtain sharp absorption peaks. The problem of the background disturbing the accuracy of an analysis has also remained unsolved. In this paper, pitches are measured as typical highly scattering samples by FT-IR spectrometer. Then, new dilution materials are developed and proposed in order to obtain fine spectra. As a result, the spectra measured by using our new dilution materials have remarkably fine quality. Our method may be able to assist in solving the existence of backgrounds, those which have remarkably disturbed the accuracy in analyzing spectra.
