Abstract
The high-energy X-ray fluorescence method has provided information of lanthanides in bulk samples without any interference of coexisting transition metals. In this study, the Kβ X-ray fluorescence spectra of Ce and Gd were measured with high-energy X-rays from a synchrotron-radiation source. The energy-dispersive spectra of Ce were measured with a Ge solid-state detector and analog/digital electronics for signal processing. It was shown that the intensities of the Kβ X-ray fluorescence spectra varied with the electronics used for signal processing and the experimental conditions (fluorescent intensity). This result should be noted for analytical applications using spectral intensities. To obtain higher energy-resolution spectra, a wavelength-dispersive measurement with a crystal monochromator and an imaging plate was also investigated. The five Kβ peaks of Gd (Kβ3, Kβ1, Kβ5, Kβ2, KO2,3) were separately observed with 70 keV X-ray excitation, and the energy resolution was estimated to be about 60 eV at Gd Kβ1 (48.7 keV) when the IP was read out with a 100 μm resolution. The energy resolution is yet to be improved by a higher resolution IP read-out or CCD camera system. It is expected that this high-energy X-ray fluorescence spectroscopy will be useful for the analysis of many kinds of lanthanide compounds and materials in the near future. Measurements of other lanthanide's Kβ spectra are now under investigation.
