Total Electron Yield Ratios between Sample Components in Total-Electron-Yield Soft X-ray Absorption Spectroscopy

Abstract

To clarify the relationship between the total electron yield (TEY) and the composition ratio in the mixture samples, TEY X-ray absorption spectra (XAS) of some mixture samples were measured using synchrotron radiation. From the TEY-XAS of the sp²/sp³-carbon mixtures (carbon black/diamond) and the boron/carbon mixtures (amorphous boron/carbon black), TEY ratios between the compositions can be obtained as 0.12 for diamond to carbon black and as 0.32 for carbon black to boron. By using the measured TEY ratios, TEY-XAS profiles of the mixture samples can be well reproduced by the synthesized spectra. It is therefore confirmed that composition ratio will be quantitatively analyzed from the TEY-XAS measurements considering the TEY ratios among the compositions.