Determination of trace metals by fluorescent X-ray spectrometry with solvent extraction thin film method
1968 Volume 17 Issue 7 Pages 801-805
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1968 Volume 17 Issue 7 Pages 801-805
A fluorescent X-ray method for trace metals involving their concentration by solvent extraction and fixation on a myler film with an addition of polystyerne was developed.
An amount of diethyldithiocarbamate solution was added to a sample solution, and the metals were extracted into carbon tetrachloride from pH 5.9 medium. A definite amount of polystyrene was added to the extract, and it was dried up by an infrared lamp illumination to fix the complex on a myler film. The fluorescent X-ray intensity was measured, and the amounts of the components were calculated referring to the calibration curves.
The analyses were done on 15 elements including Co, Cu, Fe and Ni, and the limits of detection were 3 × 10-8 1.5×10-6 g. The lower limits of determination were 3×10-85×10-7 g for Co, Cu, Fe, Ni, Mn and Zn. The coefficient of variation was 35% with selenium as an inner standard, and the calibration lines were sufficiently linear for 025μg of metals.
