ESTIMATION OF MINIMUM DETECTION LIMIT IN SYNCHROTRON RADIATION X-RAY FLUORESCENCE ANALYSIS

Hiroki YONEZAWA; Kenji KOBAYASHI; Atsuo IIDA; Yohichi GOHSHI

doi:10.2116/bunsekikagaku.33.12_E543

Hiroki YONEZAWA, Kenji KOBAYASHI, Atsuo IIDA, Yohichi GOHSHI

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Keywords: synchrotron radiation X-ray fluorescence analysis, monochromatic excitation, minimum detection limits for element in thin sample

JOURNAL FREE ACCESS

1984 Volume 33 Issue 12 Pages E543-E545

DOI https://doi.org/10.2116/bunsekikagaku.33.12_E543

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Abstract

Minimum detection limit obtainable for elements in thin samples by synchrotron radiation X-ray fluorescence analysis was studied. The thin samples containing various kinds of elements were prepared from filter paper and excited by monochromatic X-rays of 10, 15 and 20 keV. The minimum detection limits with energy dispersive spectrometer were 0.14 to 0.35 ppm for ₂₄Cr - ₃₉Y and 0.58 to 0.81 ppm for ₆₃Eu - ₇₉Au.

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