Fluorescent X-ray spectral analysis of Cu-Al alloy and Ag-Al alloy

X-ray fluorescence spectrometric analysis using G. E X-ray fluorescence spectrometer. I

Abstract

Although X-ray fluorescence spectrometric analysis is one of the most simple and rapid methods because of its non-destructive and nonseparative procedure for sample treatment, it required various calibrations for the phenomena. accompanying X-ray excitation of elements.
In the present research, using a G. E. X-ray fluorescence spectrometer, fundamental studies were carried out on the X-ray fluorescence radiation of Cu in Al-Cu alloy, a simple alloy which would not be expected to have any resonance excitation or absorption of X-ray mutually between the components; and of Ag in Ag-Al alloy, which has a comparatively low X-ray radiation efficiency.
The radiation intensity of the CuKα and CuKβ line revealed proportionality with the Cu content of the Cu-Al alloy. The Ag Kα intensity was also proportional to the Ag % in the Ag-Al alloy.
The relation between the radiation intensity of the Cu Kα line or the Ag Kα line and the voltage or current of the primary X-ray power source were also investigated.
In the powdered sample of Al-Cu alloy, the same CuKα intensity as that of the plate specimen sample was obtained when the powder was finer than 200 mesh.
Applying these results, an analysis of the segregation of Cu in a cylindrical sample of Al Cu alloy was made.