Time and frequency mixed-domain analysis of conducted emissions for types of diode

Abstract

Electromagnetic interference (EMI) noise in time and frequency mixed domains is analyzed to understand the influence of noise source behavior on the conducted emissions in boost converters. The switching characteristics of a sillicon PiN diode and a sillicon carbide Schottky barrier diode in a boost converter are compared and evaluated as EMI noise sources, and the influence of diode switching operation on the generation and attenuation of conducted emissions are discussed on the basis of spectrogram analysis.