Visualization of noise current distribution in an SiC power module using near-field magnetic scanning

Takaaki Ibuchi; Eisuke Masuda; Tsuyoshi Funaki; Hirotaka Otake; Tatsuya Miyazaki; Yasuo Kanetake; Yutaka Sawai; Takashi Nakamura

doi:10.1587/comex.2017XBL0106

This article has now been updated. Please use the final version.

Visualization of noise current distribution in an SiC power module using near-field magnetic scanning

Takaaki Ibuchi, Eisuke Masuda, Tsuyoshi Funaki, Hirotaka Otake, Tatsuya Miyazaki, Yasuo Kanetake, Yutaka Sawai, Takashi Nakamura

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Keywords: SiC power module, parasitic inductance, near-field magnetic scanning, DC-link snubber capacitor

JOURNAL FREE ACCESS Advance online publication

Article ID: 2017XBL0106

DOI https://doi.org/10.1587/comex.2017XBL0106

The final version of this article is now available: Vol. 6 (2017), No. 10 pp. 584-589

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Abstract

This report investigates noise current distribution in the switching operation of a silicon carbide (SiC) power module for optimization of the layout and packaging design. The noise current distribution is measured via the intensity of the near-field magnetic field, and the measurement methodology visualizes the noise current distribution on a wiring plane in the power module. The effect of a direct-current-link (DC-link) snubber capacitor on suppressing the voltage overshoot and ringing oscillation is evaluated using the proposed noise current identification method.

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