IEICE Communications Express
Online ISSN : 2187-0136
ISSN-L : 2187-0136

This article has now been updated. Please use the final version.

Experimental Platform for Ethernet Communication Failures Caused by Conducted Noise from Power Conversion Circuits
Ryo ShiraiNaoki AoshimaKeiji Wada
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JOURNAL FREE ACCESS Advance online publication

Article ID: 2022XBL0081

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Abstract

This paper proposes a platform for electromagnetic interference on Ethernet communication devices due to conducted noise from power conversion circuits, focusing on the electromagnetic near-field coupling between the DC bus and the communication line. The waveforms measured on the platform during switching transients reveal the mechanism of communication failure. The Ethernet performance evaluation by a network protocol analyzer shows that the converter switching frequency impacts the communication error rate.

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