Proceedings of JIEP Annual Meeting
The 16th JIEP Annual Meeting
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Host: Japan Institute of Electronics Packaging

Comparison Between Two Methods For Measuring The IC Lead Coplanarity
Kouji Ohmori
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Keywords: Coplanarity, Laser Displacement Meter, Virtual Plane, Least Square Plane
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Pages 129

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[in Japanese]
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© 2002 by The Japan Institute of Electronics Packaging
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