Proceedings of JIEP Annual Meeting
The 18th JIEP Annual Meeting
Session ID : 18C-17
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Host: Japan

Power noise analysis by modeling LSI and PCB
*Tendo Hirai†, Tomio Satou†, Hiroyuki Orihara†
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Keywords: power noise, analysis, LSI, PCB, model
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[in Japanese]
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© 2004 by The Japan Institute of Electronics Packaging
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