Proceedings of JIEP Annual Meeting
The 18th JIEP Annual Meeting
Session ID : 17C-07
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FEM analysis of deformation and bonding processes of Cu bump
*yu kakegawaTadatomo Suga
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Effects of the temperature, contact load and surface roughness of Cu bump on the strength of low temperature Cu-Cu direct bonding were examined. By means of FEM, we calculated the contact area in the bonding processes between Cu bump and Cu sheet for various temperatures and loads, taking into account the surface roughness of them. The necessary conditions for bonding were discussed and clarified by comparison of the FEM analysis with the results of experiments.
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© 2004 by The Japan Institute of Electronics Packaging
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