Proceedings of JIEP Annual Meeting
The 20th JIEP Annual Meeting
Session ID : 23A-15
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Host: Japan Institute of Electronics Packaging

Evaluation of electronic characteristics changes in MOSFETs generated by four-point bending method
*Masaaki Koganemaru, Toru Ikeda, Noriyuki Miyazaki, Yasutomo Koide, Hajime Tomokage
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Keywords: residual stress, four-point bending method, MOSFET, transconductance, reliability
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[in Japanese]
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© 2006 by The Japan Institute of Electronics Packaging
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