Proceedings of JIEP Annual Meeting
The 17th JIEP Annual Meeting
Session ID : 12B-03
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Evaluation of the Interconnection Reliability in the Flip-chip Packages Mounted by Pressure Contact
*Takashi KondoSakae KitajoYuki FujimuraTomoo MurakamiHirofumi Nakamura
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Abstract

In the flip-chip packages mounted by pressure contact, it is necessary to enhance the interconnection reliability. In this study, we evaluated the interconnection reliability using a contact analysis and we have clarified the dependence of the interconnection reliability on insulated resins of build-up boards.

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© 2003 by The Japan Institute of Electronics Packaging
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