Proceedings of JIEP Annual Meeting
The 17th JIEP Annual Meeting
Session ID : 12C-09
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Host: japan institute of electronics packaging

Characteristic impedance measurement by TDR method using sinusoidal wave
*Fumihiro Tanji, Takehiro Takahashi, Takashi Sakusabe, Noboru Schibuya
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Keywords: characteristic impedance, sinusoidal wave, TDR method, printed wiring board, signal integrity
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[in Japanese]

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© 2003 by The Japan Institute of Electronics Packaging
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