Proceedings of JIEP Annual Meeting
The 21th JIEP Annual Meeting
Session ID : 15B-11
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Comparison of Near Field Emission and Noise Immunity in Electronic Equipment
*yoshikazu ohkubo, Takehiro Takahashi, Takashi Sakusab, Noboru Shibuya
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Keywords: EMC, electronic equipment, performance degradation, immunity, near field emission
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[in Japanese]
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© 2007 by The Japan Institute of Electronics Packaging
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