Proceedings of JIEP Annual Meeting
The 21th JIEP Annual Meeting
Session ID : 15B-14
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High accuracy measurements of Complex Permittivity of dielectric bar samples using a TM010 mode cylindrical cavity
*Hiroshi Nakai, Yoshio Kobayashi, Zhewang Ma, Hirokazu Kawabata
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Abstract
Accurate values of complex permittivity of polyethyren and PTFE bar samples have been measured by using two TM010 mode cylindrical cavities with different length. The conventional cavity perturbation method is improved on the basis of the rigorous analysis by the Ritz-Galerkin method, where the effects of sample insertion holes taken into account.
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© 2007 by The Japan Institute of Electronics Packaging
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