Proceedings of JIEP Annual Meeting
The 21th JIEP Annual Meeting
Session ID : 16A-19
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Study on Mechanical Loaded Whisker
*Hideto FujinoShouji AriizumiAkihiro Douya
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Keywords: Whisker, connector
CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
The sphere-indenter test method is known as a one of the mechanical loaded whisker tests. It said that the whiskers (filament and nodule ) on the scratch-hairlines on the plating about an indent come from the strain energy of the sphere-indenter.The distances are influenced from the center of the indent to the plateau on the wear-line, that is, they show the influenced extent of the strain energy of the sphere-indenter.Here is discussed that the distance from the center of the indent to the plateau on the wear-lines are influenced extent of the strain energy of the sphere-indenter.
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© 2007 by The Japan Institute of Electronics Packaging
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