Proceedings of JIEP Annual Meeting
The 21th JIEP Annual Meeting
Session ID : 16B-06
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Voltage Probe with Electro-optic Device for High-frequency Voltage Measurement
*Wenkai Shao, Tomohiro Inayama, Tatsuyuki Shikura, Akio Toba
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Keywords: Pockels effect
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[in Japanese]
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© 2007 by The Japan Institute of Electronics Packaging
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