Proceedings of JIEP Annual Meeting
The 21th JIEP Annual Meeting
Session ID : 16B-14
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Fritting contact using Sn and AuSn for low contact force probing test of LSI
*Kazuhiro Inoue, Kenichi Kataoka, Toshihiro Itoh, Tadatomo Suga
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Keywords: probing, contact, fritting
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[in Japanese]
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© 2007 by The Japan Institute of Electronics Packaging
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