Microwave measurements of frequency and temperature dependence of complex permittivity in the dielectric substrates for Jisso circuits

Abstract

Some measurement methods are reviewed to measure dielectric substrates in the microwave range. The complex permittivities in the normal and parallel directions of a substrate are measured separately by a balanced type circular disk resonator method and a cavity resonator method, respectively.The measured results of frequency and temperature dependences are presented for some typical dielectric substrates.