Proceedings of JIEP Annual Meeting
The 32nd JIEP Annual Meeting
Session ID : 6A2-3
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Host: Japan Institute of Electronics Packaging

The 32nd JIEP Annual Meeting
Threats and countermeasures for the counterfeit IC - Authentication and traceability using Boundary-Scan -
*[in Japanese], [in Japanese]
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© 2018 The Japan Institute of Electronics Packaging
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