ノイズ源振幅変調と相関解析に基づく放射源デバイス毎の電磁妨害波放射強度推定

吉野 慎平; 石田 千晶; 五百旗頭 健吾; 豊田 啓孝

doi:10.11486/ejisso.32.0_316

The 32nd JIEP Annual Meeting

Session ID : 8A3-3

DOI https://doi.org/10.11486/ejisso.32.0_316

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Host: Japan Institute of Electronics Packaging

The 32nd JIEP Annual Meeting

Intensity Estimation of Electromagnetic Radiation Originated from Individual Source Devices Based on Noise Source Amplitude Modulation and Correlation Analysis

*[in Japanese], [in Japanese], [in Japanese], [in Japanese]

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