Proceedings of JIEP Annual Meeting
The 39th JIEP Annual Meeting
Session ID : 11B1-3
Conference information

Host: Japan Institute of Electronics Packaging

The 39th JIEP Annual Meeting
Visual inspection of mirror-finished products and generation of defect images using GAN
*[in Japanese], [in Japanese], [in Japanese], [in Japanese]
Author information
CONFERENCE PROCEEDINGS RESTRICTED ACCESS

Details
Download PDF (3595K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© 2025 The Japan Institute of Electronics Packaging
Previous article Next article
Favorites & Alerts

Recently viewed articles
Share this page
feedback
 Top