Proceedings of JIEP Annual Meeting
The 39th JIEP Annual Meeting
Session ID : 13D4-3
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Host: Japan Institute of Electronics Packaging

The 39th JIEP Annual Meeting
A Testing Station Employing a High-Density Electrical Pluggable Interface for a 50-Gbaud × 16-Channel VCSEL-based Optical Transceiver
*[in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese]
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