Evidence for Multi-Atom Resonance X-ray Raman Spectroscopy — An in situ Low Z-element and Bond-specific X-ray Spectroscopy

Natee Sirisit; Daiki Kido; Yuki Wakisaka; Hiroko Ariga-Miwa; Satoru Takakusagi; Kiyotaka Asakura; Oki Sekizawa; Tomohiro Sakata; Tomoya Uruga; Yasuhiro Iwasawa

doi:10.1380/ejssnt.2018.387

Regular Papers

Evidence for Multi-Atom Resonance X-ray Raman Spectroscopy — An in situ Low Z-element and Bond-specific X-ray Spectroscopy

Natee Sirisit, Daiki Kido, Yuki Wakisaka, Hiroko Ariga-Miwa, Satoru Takakusagi, Kiyotaka Asakura, Oki Sekizawa, Tomohiro Sakata, Tomoya Uruga, Yasuhiro Iwasawa

Author information

Natee Sirisit
Institute for Catalysis and Division of Quantum Science and Technology, Graduate School of Engineering, Hokkaido University
Daiki Kido
Institute for Catalysis and Division of Quantum Science and Technology, Graduate School of Engineering, Hokkaido University
Yuki Wakisaka
Institute for Catalysis and Division of Quantum Science and Technology, Graduate School of Engineering, Hokkaido University
Hiroko Ariga-Miwa
Institute for Catalysis and Division of Quantum Science and Technology, Graduate School of Engineering, Hokkaido University
Satoru Takakusagi
Institute for Catalysis and Division of Quantum Science and Technology, Graduate School of Engineering, Hokkaido University
Kiyotaka Asakura
Institute for Catalysis and Division of Quantum Science and Technology, Graduate School of Engineering, Hokkaido University
Oki Sekizawa
Department of Applied Physics and Chemistry, The University of Electro-Communications
Japan Synchrotron Research Institute (JASRI)
Tomohiro Sakata
Department of Applied Physics and Chemistry, The University of Electro-Communications
Japan Synchrotron Research Institute (JASRI)
Tomoya Uruga
Department of Applied Physics and Chemistry, The University of Electro-Communications
Japan Synchrotron Research Institute (JASRI)
Yasuhiro Iwasawa
Department of Applied Physics and Chemistry, The University of Electro-Communications

Keywords: X-ray absorption fine structure, XAFS, Multi-atom resonance, In situ, Synchrotron radiation

JOURNAL FREE ACCESS

2018 Volume 16 Pages 387-390

DOI https://doi.org/10.1380/ejssnt.2018.387

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Abstract

We have shown a possibility of multi-atom resonant X-ray Raman (MARX-Raman) spectroscopy by measuring the N K-edge loss spectrum of TaN at Ta L₃-edge and C K-edge loss spectrum of Er(C₅H₅)₃ at Er L₁-edge. When the excitation X-ray energy was tuned to the Ta L₃-edge and inelastic scattering spectra were recorded around 400 eV loss corresponding to the N K-edge Raman region, we found a clear enhancement of emission spectrum. The same enhancement was observed in C K-edge Raman region in Er(C₅H₅)₃. These experimental results have indicated the possibility of MARX-Raman phenomenon which may lead to a new in situ and bond-specific XAFS spectroscopy for low Z elements. [DOI: 10.1380/ejssnt.2018.387]

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