Abstract
Time-resolved Raman scattering spectroscopy was applied to study the field-induced orientation process of a ferroelectric liquid crystal (FLC) cell fabricated at the bottom of a high refraction hemi-cylindrical prism. The method allowed us to measure selectively Raman scattering (RS) spectra from the FLC in a bulk phase and those from the FLC near an SiO_X alignment layer. Time-resolved RS spectra from the two parts were measured by applying stepwise external electric fields, indicating that the FLC near the alignment layer exhibits a retarded response to the field compared to that in the bulk phase. The results proved the usefulness of the proposed method.