Abstract
Optical retardation R of a retardation film which used for optical compensation of liquid crystal displays (LCDs) is generally obtained from the phase difference D between the fast axis and slow axis of transmitting light. However, the conventional measuring method cannot determine the optical properties of the retardation film such as refractive index, film thickness, director orientation and tilt angle, individually. In this paper, we report how to determine the optical properties of retardation films using ellipsometric parameters which obtained from transmission and reflection measurements.
